Characterizing crystalline materials with terahertz spectroscopy

被引：0
|
作者：
Ahmed, Zeeshan [1 ]
Plusquellic, David F. [1 ]
机构：
[1] NIST, Gaithersburg, MD 20899 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2013年 / 245卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
337-ANYL
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页数：1
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