Enhancement of MCM testability using an embedded reconfigurable FPGA

被引：0
|
作者：
York, J
Powell, T
Dehkordi, P
Bouldin, D
机构：
来源：
SECOND ANNUAL IEEE INTERNATIONAL CONFERENCE ON INNOVATIVE SYSTEMS IN SILICON, 1997 PROCEEDINGS | 1997年
关键词：
D O I：
10.1109/ICISS.1997.630257
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The testability of an MCM can be enhanced significantly for very little cost whenever a reprogrammable FPGA component that is already embedded in the MCM for functionality is utilized for diagnostics. This approach can have some of the characteristics of a smart substrate which uses the scan cell beside-the-signal-path (BSP) methodology. The design and implementation of an MCM with this capability is presented along with descriptions of the self-test algorithms, fault isolation and real-time testing and monitoring that this method provides.
引用
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页码：165 / 173
页数：9
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