Effects of wall random roughness on TE and TM modes in a hollow conducting waveguide

被引：9

作者：

Mendoza-Suárez, A

Ruíz-Corona, U

Espinosa-Luna, R

机构：

[1] Ctr Invest Opt AC, Guanajuato 37150, Mexico

[2] Univ Michoacana San Nicolas Hidalgo, Escuela Ciencias Fis Matemat, Morelia 58060, Michoacan, Mexico

[3] Inst Nacl Astrofis Opt & Elect, Puebla 72000, Mexico

来源：

OPTICS COMMUNICATIONS | 2004年 / 238卷 / 4-6期

关键词：

polarization wave optics;

D O I：

10.1016/j.optcom.2004.05.007

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a new formalism which can be used to calculate the TE and TM modes for a hollow, with random wall roughness, conducting waveguide. The statistical properties associated to the wall roughness are consistent with a Gaussian random process. We study the effect of small wall roughness on the modes of circular waveguides. Our numerical results show that, for the small roughness studied, the main effect is just a symmetrization of all the eigenstates considered. That is, for these states the angular dependence almost vanishes. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：291 / 299

页数：9

共 45 条

[1] Effects of surface roughness on TM modes in rectangular waveguide
Chen, Juan
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