System for High Temperature Spectral Emissivity Measurement of Materials for VHTR Applications

被引:0
|
作者
Slattery, Stuart R. [1 ]
Malaney, Tamara L. [1 ]
Weber, Scott J. [1 ]
Anderson, Mark H. [1 ]
Sridharan, Kumar [1 ]
Allen, Todd R. [1 ]
机构
[1] Univ Wisconsin, Dept Engn Phys, Madison, WI 53706 USA
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中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
An experimental system for in situ high temperature measurements of spectral emissivity of VHTR materials has been designed and constructed. The design consists of a cylindrical block of silicon carbide with several machined cavities for placement of test samples, as well as a black body cavity. The block is placed inside a furnace for heating to temperatures up to 1000 degrees C. A shutter system allows for selective exposure of any given test sample for emissivity measurements. An optical periscope guides the thermal radiation from the sample to a Fourier Transform Infra Red (FTIR) spectrometer which is used for real-time measurements of spectral emissivity over a wavelength range of 0.8 mu m to 10 mu m. To specifically address the needs of VHTR applications, the system has been designed for studies with VHTR grade helium environments and air transients. Inlet and outlet gas compositions are measured using a gas chromatograph, which in conjunction with ex situ analysis of the samples by electron microscopy and x-ray diffraction will allow for the correlation of surface corrosion of the materials and their spectral emissivities under different operating and accident conditions.
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页码:691 / 698
页数:8
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