Virtual Instruments in dimensional metrology

被引:0
|
作者
de Vicente y Oliva, Jesus [1 ]
Sanchez Perez, Angel Maria [1 ]
Hernandez Perdomo, Wilmar [1 ]
机构
[1] Univ Politecn Madrid, E-28040 Madrid, Spain
关键词
D O I
暂无
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
During the last five years, in order to improve understanding of content related to "Coordinate Metrology", the Laboratorio de Metrologia y Metrotecnia (LMM) from the Polytechnic University of Madrid offers its PhD students, as a course work, the construction of a virtual instrument. This virtual instrument simulates the imaging of a part to be measured by optical dimensional metrology instruments (microscopes, profile projectors, vision machines). The LMM provides students with images similar to those they would obtain with real instrumentation for the instrument adjustment and calibration process. Working with these images, students should determine the adjustment parameters of the virtual instrument. Once these parameters are set, the student can perform the proper calibration of the virtual instrument. Beyond this process, the instrument is already able to perform traceable measurement. In order to do that, LMM offers students some images of parts. Students should perform some measurements using those images and estimate the corresponding uncertainties.
引用
收藏
页码:106 / 118
页数:13
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