Resolving Voltage-Time Dilemma Using an Atomic-Scale Lever of Subpicosecond Electron-Phonon Interaction

被引:17
|
作者
Yang, Xiang [1 ]
Tudosa, Joan [1 ]
Choi, Byung Joon [1 ]
Chen, Albert B. K. [1 ]
Chen, I-Wei [1 ]
机构
[1] Univ Penn, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA
基金
美国国家科学基金会;
关键词
Resistive switching memory; amorphous materials; metal insulator transition; electron-phonon interaction plasmonic; pressure (effect); PHASE-CHANGE MATERIALS; EXTERNAL ELECTROMAGNETIC-FIELD; METAL-INSULATOR TRANSITIONS; LASER SPALLATION TECHNIQUE; RANDOM-ACCESS MEMORY; NANOCRYSTAL MEMORIES; DESIGN OPTIMIZATION; RESISTIVE SWITCHES; NONVOLATILE MEMORY; INTERFACE STRENGTH;
D O I
10.1021/nl501710r
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Nanoelectronic memory based on trapped charge need to be small and fast, but fundamentally it faces a voltage-time dilemma because the requirement of a high-energy barrier for data retention under zero/low electrical stimuli is incompatible with the demand of a low-energy barrier for fast switching under a modest programming voltage. One solution is to embed an atomic-level lever of localized electron-phonon interaction to autonomously reconfigure trap-site's barrier in accordance to the electron-occupancy of the site. Here we demonstrate an atomically levered resistance-switching memory built on locally flexible amorphous nanometallic thin films: charge detrapping can be triggered by a mechanical force, the fastest one being a plasmonic Lorentz force induced by a nearby electron or positron bunch passing in 10(-13) s. The observation provided the first real-time evidence of an electron-phonon interaction in action, which enables nanometallic memory to turn on at a subpicosecond speed yet retain long-term memory, thus suitable for universal memory and other nanoelectron applications.
引用
收藏
页码:5058 / 5067
页数:10
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