Research on the Emission Uniformity of Explosive Emission Cathodes in Foilless Diodes

被引:30
|
作者
Sun, Jun [1 ]
Wu, Ping [1 ,2 ]
Huo, Shaofei [1 ]
Tan, Weibing [1 ]
Shao, Hao [1 ]
Chen, Changhua [1 ]
Liu, Guozhi [1 ,2 ]
机构
[1] Northwest Inst Nucl Technol, Xian 710024, Peoples R China
[2] Tsinghua Univ, Beijing 100084, Peoples R China
关键词
Cathode morphology; emission uniformity; explosive emission cathodes (EECs); foilless diodes; high-power microwave (HPM);
D O I
10.1109/TPS.2014.2338301
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Some factors that influence the emission uniformity of explosive emission cathodes (EECs) in foilless diodes such as the guiding magnetic field strength and the rise rate of electric field have been researched in former literatures. This paper is concentrated on another factor that has been overlooked previously, i.e., the defects with dimensions of tens of micrometers on cathode surfaces, especially at blade edges. It is shown that these defects will significantly worsen the emission uniformity of EECs by introducing extraordinarily large microscopic field enhancement factors, and thus they should be eliminated. The micrometer-scale irregularities, however, should be maintained to provide effective emission micropoints. Meanwhile, the outer edge of an annular cathode blade should be rounded off to improve the emission uniformity. After being disposed like this, the emission uniformity of annular graphite cathodes in a foilless diode is obviously improved, which leads to an increase of energy efficiency by more than 20% by broadening the microwave pulse duration under a power level of 2.8 GW for an X-band relativistic backward wave oscillator.
引用
收藏
页码:2179 / 2185
页数:7
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