Depairing current density of Nd2-xCexCuO4-δ superconducting films

被引：12

作者：

Kunchur, Milind N. ^{[1
]}

Dean, Charles ^{[1
]}

Liang, Manlai ^{[1
]}

Moghaddam, Nahid S. ^{[1
]}

Guarino, Anita ^{[2
]}

Nigro, Angela ^{[2
]}

Grimaldi, Gaia ^{[2
]}

Leo, Antonio ^{[2
]}

机构：

[1] Univ S Carolina, Dept Phys & Astron, Columbia, SC 29208 USA

[2] Univ Salerno, CNR SPIN UOS Salerno, Dipartimento Fis ER Caianiello, I-84084 Salerno, Italy

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2013年 / 495卷

关键词：

NCCO; Cuprate; Critical current; Pair-breaking; PENETRATION DEPTH; PURITY DEPENDENCE; PAIR-BREAKING; TEMPERATURE;

D O I：

10.1016/j.physc.2013.08.005

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report a measurement of the depairing critical current density in the electron-doped Nd2-xCexCuO4--delta cuprate superconductor. Resistance-versus-temperature transition curves measured at high pulsed current densities show the classic proportionality between the transition-temperature shift and the two-thirds power of the applied current. The measurement provides an alternative method for obtaining the penetration depth purely through transport measurements that is not affected by the large paramagnetic background that arises from the Nd3+ ions, which affects inductive investigations of this quantity. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：66 / 68

页数：3

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