PIXE and XRF comparison for applications to sediments analysis

被引：30
|
作者：
Benyaich, F
Makhtari, A
Torrisi, L
Foti, G
机构：
[1] UNIV MESSINA,DIPARTIMENTO FIS,SALITA SPERONE,S AGATA MESSINA,ITALY
[2] UNIV CATANIA,DIPARTIMENTO FIS,I-95129 CATANIA,ITALY
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1997年 / 132卷 / 03期
关键词：
PIXE; XRF; ion beam analysis; sediments analysis; elemental composition; trace element detection; environmental pollution; spectrum fitting; computer simulation;
D O I：
10.1016/S0168-583X(97)00404-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The potential of particle induced X-ray emission (PIXE) and X-ray fluorescence (XRF) is compared with regard to its application to sediments analysis, The intrinsic features of each of the two techniques are addressed, and their elemental sensitivities are evaluated and compared, showing that in the case of sediments analysis, due to the complexity of their composition, the two techniques are complementary. (C) 1997 Elsevier Science B.V.
引用
收藏
页码：481 / 488
页数：8
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