Cryogenic testing of by-pass diode stacks for the superconducting magnets of the Large Hadron Collider at CERN

被引：0

作者：

della Corte, A ^{[1
]}

Gharib, A ^{[1
]}

Hagedorn, D ^{[1
]}

Turtù, S ^{[1
]}

Basile, GL ^{[1
]}

Catitti, A ^{[1
]}

Chiarelli, S ^{[1
]}

Di Ferdinando, E ^{[1
]}

Taddia, G ^{[1
]}

Talli, M ^{[1
]}

Verdini, L ^{[1
]}

Viola, R ^{[1
]}

机构：

[1] ENEA, I-00044 Frascati, Rome, Italy

来源：

ADVANCES IN CRYOGENIC ENGINEERING, VOL 47, PTS A AND B | 2002年 / 613卷

关键词：

D O I：

暂无

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

A dedicated facility prepared by ENEA (Italian Agency for Energy and Environment) for the cryogenic testing of by-pass diodes for the protection of the CERN Large Hadron Collider main magnets will be described. This experimental activity is in the frame of a contract awarded to OCEM, an Italian firm active in the field of electronic devices and power supplies, in collaboration with ENEA, for the manufacture and testing of all the diode stacks. In particular, CERN requests the measurement of the reverse and forward voltage diode characteristics at 300 K and 77 K, and endurance test cycles at liquid helium temperature. The experimental set-up at ENEA and data acquisition system developed for the scope will be described and the test results reported.

引用

页码：131 / 138

页数：8

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