Intergrowth microstructures of MnF2 subjected to shock compression

被引：0
|
作者：
Yubuta, K. [1 ]
Hongo, T. [2 ]
Atou, T. [2 ]
Nakamura, K. G. [2 ]
Kondo, K. -I. [2 ]
Kikuchi, M. [3 ]
机构：
[1] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
[2] Tokyo Inst Technol, Mat & Struct Lab, Yokohama, Kanagawa 2268503, Japan
[3] Tohoku Fukushi Univ, Kansei Fukushi Lab, Sendai, Miyagi 9893201, Japan
来源：
PHILOSOPHICAL MAGAZINE | 2009年 / 89卷 / 04期
关键词：
shock compression; intergrowth; ledge structure; electron diffraction; high-resolution transmission; electron microscopy image; HIGH-PRESSURE; PHASE-TRANSITION; DISCONNECTIONS; TRANSFORMATION; POLYMORPHISM; CRYSTAL; RUTILE;
D O I：
10.1080/14786430802620724
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and alpha-PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile- type but not the alpha-PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.
引用
收藏
页码：323 / 330
页数：8
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