Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits

被引：2

作者：

Rahimi, Somayyeh ^{[1
]}

Schmidt, Christian ^{[1
]}

Liao, Joy ^{[1
]}

Marks, Howard Lee ^{[1
]}

Shin, Kyung Mo ^{[1
]}

机构：

[1] NVIDIA Corp, 2701 San Tomas EXPY, Santa Clara, CA 95050 USA

来源：

2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2020年

关键词：

IDDQ; Input/Output Leakage; Ring Oscillator Frequency; Surface Mount Technology; Total Ionizing Dose; V-min;

D O I：

10.1109/irps45951.2020.9128356

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

X-Ray imaging is widely used in the semiconductor industry, for failure analysis and for in-line inspection of surface mount devices. Here, we investigate the TID-induced degradation of logic ICs, which happens after long-term exposure to X-Ray. The observed degradation is mainly in the form of an increase in the leakage of input/output pins and the IDDQ of their circuitry. Annealing at high temperature is shown to partially recover the leakage degradation caused by the radiation.

引用

页数：4

共 50 条

[31] X-ray Cherenkov radiation
Ispirian, KA
Advanced Radiation Sources and Applications, 2006, 199 : 217 - 234
[32] Calibration Procedures for X-ray Streak Cameras and Elements of X-ray Measuring Circuits
V. P. Lazarchuk
A. N. Muntyan
V. M. Murugov
S. I. Petrov
A. V. Senik
Instruments and Experimental Techniques, 2004, 47 : 255 - 259
[33] Calibration procedures for X-ray streak cameras and elements of X-ray measuring circuits
Lazarchuk, VP
Muntyan, AN
Murugov, VM
Petrov, SI
Senik, AV
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2004, 47 (02) : 255 - 259
[34] Anomalous X-ray diffraction with soft X-ray synchrotron radiation
Carpentier, P
Berthet-Colominas, C
Capitan, M
Chesne, ML
Fanchon, E
Lequien, S
Stuhrmann, H
Thiaudière, D
Vicat, J
Zielinski, P
Kahn, R
CELLULAR AND MOLECULAR BIOLOGY, 2000, 46 (05) : 915 - 935
[35] Parametric X-ray radiation as a novel source for X-ray imaging
Takahashi, Yumiko
Hayakawa, Yasushi
Kuwada, Takao
Tanaka, Toshinari
Sakae, Toshiro
Nakao, Keisuke
Nogami, Kyoko
Imagaki, Manabu
Hayakawa, Ken
Sato, Isamu
X-RAY SPECTROMETRY, 2012, 41 (04) : 210 - 215
[36] RELIABILITY OF THE X-RAY TENSOMETRIC MEASUREMENT
KRAUS, I
KRALOVA, R
MIKOLASEK, M
SALEH, H
KOVOVE MATERIALY-METALLIC MATERIALS, 1979, 17 (03): : 363 - 368
[37] RELIABILITY OF X-RAY CRYSTALLOGRAPHIC STRUCTURES
BOTT, R
MOLECULAR MODELING: FROM VIRTUAL TOOLS TO REAL PROBLEMS, 1994, 576 : 18 - 28
[38] RELIABILITY OF X-RAY EXAMINATION OF CHEST
不详
JAMA-JOURNAL OF THE AMERICAN MEDICAL ASSOCIATION, 1947, 135 (14): : 956 - 956
[39] An Integrated X-Ray/bioluminescence Tomography System for Radiation Guidance and Tumor Evaluation
Shi, J.
Udayakumar, T.
Wang, Z.
Dogan, N.
Pollack, A.
Yang, Y.
MEDICAL PHYSICS, 2016, 43 (06) : 3901 - 3902
[40] Parametric X-ray radiation for calibration of X-ray space telescopes and generation of several X-ray beams
Shchagin, AV
Khizhnyak, NA
Fiorito, RB
Rule, DW
Artru, X
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 173 (1-2): : 154 - 159

← 1 2 3 4 5 →