Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation

被引：3

作者：

Ciappa, Mauro ^{[1
]}

Mangiacapra, Luigi ^{[1
]}

Stangoni, Maria ^{[2
]}

Ott, Stephan ^{[2
]}

Fichtner, Wolfgang ^{[1
]}

机构：

[1] ETH Zentrum, Swiss Fed Inst Technol ETH, Integrated Syst Lab, CH-8092 Zurich, Switzerland

[2] HUBER SUHNER AG, Wire Cable Div, R&D, CH-8330 Pfaeffikon, Switzerland

来源：

MICROELECTRONICS RELIABILITY | 2009年 / 49卷 / 9-11期

关键词：

D O I：

10.1016/j.microrel.2009.07.035

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The reliability of electric cables and wires using electron beam crosslinked polymers as isolator materials strongly depends on the accuracy in predicting the dose deposited during irradiation. This paper presents the main reliability issues that can be encountered in field operation, experimental data showing the criticality of the dose parameter, and proposes the use of a built-in reliability approach based on Monte Carlo simulation to design optimum processing conditions. The main requirements and advantages of the Monte Carlo based methodology are discussed in conjunction with the limitations of the traditional heuristic calculation procedure. Finally, Monte Carlo simulation is used for the first time to point out some relevant effects that occur during processing and that can lead to severe dose estimation errors. (C) 2009 Elsevier Ltd. All rights reserved.

引用

页码：972 / 976

页数：5

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