Next-generation silicon analysis tools for RF integrated-circuits

被引:0
|
作者
Mehrotra, Amit [1 ]
Narayan, Amit [1 ]
Subramanian, Ravi [1 ]
机构
[1] Berkeley Design Automat Inc, 2902 Stender Way, Santa Clara, CA 95054 USA
关键词
RFIC; EDA; CAD; verification; analysis; simulation VCO; PLL; transceiver; analog; RF; stochastic nonlinear; multi-tone;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper introduces new circuit analysis technology targeted to address the growing gap between what current circuit verification technology can deliver for today's analog and RF integrated circuit designs, compared to what is observed and measured in silicon. We present key powerful new techniques for the precise and fast analysis and verification of RF integrated circuits. We also provide an overview of the key innovations in applied mathematics, numerical techniques, and software architecture that allow high speed and precision to be delivered together in circuit analysis. These techniques, taken together, comprise Precision Circuit Analysis technology-targeted to address the growing verification problems found in the majority of today's commercial analog/RF-rich integrated circuits. We demonstrate the application of this technology on commercially shipping designs in wireless, networking, and SoC applications.
引用
收藏
页码:411 / +
页数:2
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