A 160x120 ROTC with Non-uniformity Calibration for Silicon Diode Uncooled IRFPA

被引：0
|
作者：
Zhu, Yajun [1 ]
Niu, Yuze [1 ]
Lu, Wengao [1 ]
Huang, Zhaofeng [1 ]
Zhang, Yacong [1 ]
Chen, Zhongjian [1 ]
机构：
[1] Peking Univ, Dept Microelect, Key Lab Microelect Devices & Circuits, Beijing, Peoples R China
来源：
2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC) | 2019年
关键词：
ROIC; Uncooled IRFPA; Silicon Diode; NUC; Blind Pixel; Low-noise DAC;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents a ROIC (Readout Integrated Circuit) with NUC (Non-uniformity Calibration), which is applied in a silicon diode uncooled IRFPA (Infrared Focal Plane Array). We propose blind pixel to calibrate chip temperature non-uniformity and DAC-based calibration for calibrating process non-uniformity. The ROIC is fabricated using a 0.35 mu m CMOS process with array size of 160x120. Power consumption of the ROIC is 41mW, noise of the DAC is less than 2 mu V, and the circuit's SNR (Signal-to-Noise Ratio) is 72dB.
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页数：3
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