Surface roughness measurement by using interferometer and active interferometer stabilization

被引:0
|
作者
Kim, Jin-Tae
Kim, Dohyoung
Kim, Hyun Su
Park, Jong Rak
机构
[1] Chosun Univ, Dept Photon Eng, Kwangju, South Korea
[2] Chosun Univ, Dept Appl Photon Eng, Kwangju, South Korea
关键词
interferometer; laser; surface profile; phase shifting; stabilization;
D O I
10.4028/www.scientific.net/KEM.321-323.99
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The profile of the mirror surface is measured by using optical phase shift method and Twymann-Green interferometer. Phase map is calculated by applying 4-buckets method and Vikhagen phase shift algorithm is applied to escape convolution errors. From that the obtained roughness of the mirror surface is around 20 nm, rms roughness value. Also, the interferometer was stabilized by using fringe locking method. Also, we propose two colors method very precise surface profile and the length can be measured in the harsh environmental conditions.
引用
收藏
页码:99 / 102
页数:4
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