Uncertainty quantification for monotone stochastic degradation models

被引:35
|
作者
Chen, Piao [1 ]
Ye, Zhi-Sheng [1 ]
机构
[1] Inst High Performance Comp, Singapore, Singapore
基金
新加坡国家研究基金会;
关键词
coverage probability; Gamma process; generalized pivotal quantity; inverse Gaussian process; INVERSE GAUSSIAN PROCESS; WIENER-PROCESSES; GAMMA PROCESSES; RELIABILITY; INFERENCE; INTERVALS; DESIGN; LIFE;
D O I
10.1080/00224065.2018.1436839
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Degradation data are an important source of product reliability information. Two popular stochastic models for degradation data are the Gamma process and the inverse Gaussian (IG) process, both of which possess monotone degradation paths. Although these two models have been used in numerous applications, the existing interval estimation methods are either inaccurate given a moderate sample size of the degradation data or require a significant computation time when the size of the degradation data is large. To bridge this gap, this article develops a general framework of interval estimation for the Gamma and IG processes based on the method of generalized pivotal quantities. Extensive simulations are conducted to compare the proposed methods with existing methods under moderate and large sample sizes. Degradation data from capacitors are used to illustrate the proposed methods.
引用
收藏
页码:207 / 219
页数:13
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