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Patent citations as a measure of knowledge flows:: The influence of examiner citations
被引:455
|作者:
Alcacer, Juan
[1
]
Gittelman, Michelle
[1
]
机构:
[1] NYU, Stern Sch Business, New York, NY USA
关键词:
D O I:
10.1162/rest.88.4.774
中图分类号:
F [经济];
学科分类号:
02 ;
摘要:
Analysis of patent citations is a core methodology-in the study of knowledge diffusion. However, citations made by patent examiners have not been separately reported, adding unknown noise to the data. We leverage a recent change in the reporting of patent data showing citations added by examiners. The magnitude is high: two-thirds of citations on the average patent are inserted by examiners. Furthermore, 40% of all patents have all citations added by examiners. We analyze the distribution of examiner and inventor citations with respect to self-citation, distance, technology overlap, and vintage. Results indicate that inferences about inventor knowledge using pooled citations may suffer from bias or overinflated significance levels.
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页码:774 / 779
页数:6
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