Interaction of the O atom with the InSe monolayer: A first-principles study

被引:6
|
作者
He, Bingling [1 ]
Lu, Zhansheng [2 ]
Ma, Dongwei [3 ]
机构
[1] Xinxiang Univ, Coll Phys & Elect Engn, Xinxiang 453003, Peoples R China
[2] Henan Normal Univ, Coll Phys & Mat Sci, Xinxiang 453007, Peoples R China
[3] Anyang Normal Univ, Sch Phys, Anyang 455000, Peoples R China
基金
中国国家自然科学基金;
关键词
First-principles calculation; Inse; Oxygen impurity; Adsorption; Diffusion; Electronic structure; BLACK PHOSPHORUS; LAYERED INSE; AB-INITIO; OXIDATION; NANOSHEETS; MOBILITY; AIR; TRANSISTORS; ADSORPTION; SILICENE;
D O I
10.1016/j.vacuum.2018.04.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The interaction of the O impurity atom with the InSe monolayer has been investigated by using first principles calculations. O atoms energetically highly tend to be located at the inner of the material between the In-In bond. The energy barrier (0.53 eV) for the O diffusion from the topmost atomic layer to the material inner is much smaller than that (1.12 eV) for the diffusion across the topmost atomic layer. These suggest that the O atom on the topmost atomic layer can rapidly diffuse into the material inner far below room temperature. However, the rapid diffusion of the O atom in the material inner may need an elevated temperature, due to its higher diffusion energy barrier of 0.99 eV. For the electronic structure, O impurity single atoms are most likely to only induce a slight change in the bandgap, and moderate changes in the band dispersion and the carrier effective masses of the valence and conduction bands. Further, a higher concentration of O impurities in the inner of InSe has been studied. Our studies are helpful for understanding of the oxidation, enviromental stability, and electronic properties of InSe two-dimensional semiconductors at the atomic level, due to the O impurity. (C) 2018 Elsevier Ltd. All rights reserved.
引用
收藏
页码:53 / 61
页数:9
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