Method for determining the junction temperature of alternating current light-emitting diodes

被引:8
|
作者
Hwu, F. -S. [1 ,3 ]
Sheu, G. -J. [1 ]
Lin, M. -T. [1 ,2 ]
Chen, J. -C. [1 ]
机构
[1] Natl Cent Univ, Dept Mech Engn, Jhongli 32001, Taiwan
[2] Ind Technol Res Inst, Elect & Optoelect Res Labs, Chutung Town 310, Taiwan
[3] Nanya Inst Technol, Dept Mech Engn, Jhongli 32091, Taiwan
关键词
OPERATION;
D O I
10.1049/iet-smt:20080096
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A numerical simulation was used to simulate the temperature distribution during AC and DC operations of an alternating current light-emitting diode (AC LED). The relationship between the junction temperature and the temperature at the centre of the bottom surface of the submount of an AC LED was measured under DC operation. This relationship was confirmed by numerical simulation. The numerical results were consistent with the experimental observations in that the temperature at the centre of the bottom surface of the submount was insensitive to the current variations that occur in an AC LED, probably because of the large mass of the submount. However, it was difficult to measure the temperature oscillation at the junctions in an AC LED, although this oscillation can be clearly seen in the numerical results. Thus, the authors propose a formula for predicting the range of the oscillating junction temperature for an AC LED.
引用
收藏
页码:159 / 164
页数:6
相关论文
共 50 条
  • [1] Method for measuring the mean junction temperature of alternating current light-emitting diodes
    Hwu, F. S.
    Yang, C. H.
    Chen, J. C.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2011, 22 (04)
  • [2] A Bipolar-Pulse Voltage Method for Junction Temperature Measurement of Alternating Current Light-Emitting Diodes
    Zhu, Honghui
    Lu, Yijun
    Wu, Tingzhu
    Guo, Ziquan
    Zhu, Lihong
    Xiao, Jingjing
    Tu, Yi
    Gao, Yulin
    Lin, Yue
    Chen, Zhong
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (05) : 2326 - 2329
  • [3] Method to design alternating current light-emitting diodes luminous flux
    Yingming Gao
    Huanyue Zhang
    Xu Guo
    Fan Cao
    Jingjie Yu
    Ailin Chen
    Nianyu Zou
    [J]. Optical and Quantum Electronics, 2015, 47 : 3715 - 3727
  • [4] Method to design alternating current light-emitting diodes luminous flux
    Gao, Yingming
    Zhang, Huanyue
    Guo, Xu
    Cao, Fan
    Yu, Jingjie
    Chen, Ailin
    Zou, Nianyu
    [J]. OPTICAL AND QUANTUM ELECTRONICS, 2015, 47 (12) : 3715 - 3727
  • [5] Junction temperature in ultraviolet light-emitting diodes
    Xi, YG
    Gessmann, T
    Xi, JQ
    Kim, JK
    Shah, JM
    Schubert, EF
    Fischer, AJ
    Crawford, MH
    Bogart, KHA
    Allerman, AA
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (10): : 7260 - 7266
  • [6] Thermal analyses of alternating current light-emitting diodes
    Zhang, Ji-Hong
    Wu, Bi-Qing
    Shih, Tien-Mo
    Lu, Yi-Jun
    Gao, Yu-Lin
    Chang, Richard Ru-Gin
    Chen, Zhong
    [J]. APPLIED PHYSICS LETTERS, 2013, 103 (15)
  • [7] Junction-Temperature Determination in InGaN Light-Emitting Diodes Using Reverse Current Method
    Wu, Biqing
    Lin, Siqi
    Shih, Tien-Mo
    Gao, Yulin
    Lu, Yijun
    Zhu, Lihong
    Chen, Guolong
    Chen, Zhong
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (01) : 241 - 245
  • [8] Measurement of junction temperature of light-emitting diodes in a luminaire
    Shailesh, K. R.
    Kurian, C. P.
    Kini, S. G.
    [J]. LIGHTING RESEARCH & TECHNOLOGY, 2015, 47 (05) : 620 - 632
  • [9] RADIOMETRIC DETERMINATION OF THE JUNCTION TEMPERATURE OF LIGHT-EMITTING DIODES
    Vaskuri, A.
    Karha, P.
    Baumgartner, H.
    Oksanen, J.
    Riuttanen, L.
    Andor, G.
    Ikonen, E.
    [J]. PROCEEDINGS OF THE CIE CENTENARY CONFERENCE TOWARDS A NEW CENTURY OF LIGHT, 2013, : 308 - 316
  • [10] Determining Junction Temperature in InGaN Light-Emitting Diodes Using Low Forward Currents
    Lin, Siqi
    Shih, Tienmo
    Lu, Yijun
    Gao, Yulin
    Zhu, Lihong
    Chen, Guolong
    Wu, Biqing
    Guo, Ziquan
    Zhang, Jihong
    Fan, Xianguang
    Chang, Richard Rugin
    Chen, Zhong
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (11) : 3775 - 3779