MICROBEAM X-RAY DIFFRACTION MEASUREMENT OF STRAIN

被引：0
|
作者：
Noyan, I. C. [1 ]
机构：
[1] IBM Res Div, Yorktown Hts, NY 10598 USA
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2002年 / 58卷
关键词：
MICRODIFFRACTION; MICROTOPOGRAPHY; ELECTROMIGRATION;
D O I：
10.1107/S0108767302086051
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：C24 / C24
页数：1
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