Enhancement of near-band-edge photoluminescence of ZnO thin films in sandwich configuration at room temperature

被引:19
|
作者
Hong, RJ [1 ]
Shao, JD
He, HB
Fan, ZX
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Res & Dev Ctr Opt Thin Film Coatings, Shanghai 201800, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100864, Peoples R China
关键词
D O I
10.1063/1.2198934
中图分类号
O59 [应用物理学];
学科分类号
摘要
ZnO/ITO/ZnO sandwich structure films were fabricated. The effects of buffer layer on the structure and optical properties of ZnO films were investigated by x-ray diffraction (XRD), photoluminescence, optical transmittance, and absorption measurements. XRD spectra indicate that a buffer layer has the effects of lowering the grain orientation of ZnO films and increasing the residual stresses in the films. The near-band-edge emissions of ZnO films deposited on both single indium tin oxide (ITO) buffer and ITO/ZnO double buffers are significantly enhanced compared with that deposited on a bare substrate due to the quantum confinement effect. (C) 2006 American Institute of Physics.
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页数:3
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