piezomodulated reflectance spectra;
InAs/GaAs surface QDs;
Lorentz line shape fitting;
D O I:
10.7498/aps.55.4934
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
Piezomodulated reflectance (PzR) spectra have been measured for two samples of InAs surface quantum dots (SQDs) deposited on GaAs (311) B substrates with In-0.35 Ga-0.65 As template. At 77K multiple confined-state SQDs transitions can be clearly resolved from the PzR spectra. The detailed optical transition features of SQDs, QDs buried by capping layer, In-0.35 Ga-0.65 As template and GaAs substrate layers were obtained from well-fitted PzR spectra using the first or third derivative of a Lorentz line shape. Differences between PzR results of two samples were discussed qualitatively.