A piezomodulated reflectance study of InAs/GaAs surface quantum dots

被引:1
|
作者
Yu Chen-Hui [1 ]
Wang Chong
Gong Qian
Zhang Bo
Lu Wei
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
关键词
piezomodulated reflectance spectra; InAs/GaAs surface QDs; Lorentz line shape fitting;
D O I
10.7498/aps.55.4934
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Piezomodulated reflectance (PzR) spectra have been measured for two samples of InAs surface quantum dots (SQDs) deposited on GaAs (311) B substrates with In-0.35 Ga-0.65 As template. At 77K multiple confined-state SQDs transitions can be clearly resolved from the PzR spectra. The detailed optical transition features of SQDs, QDs buried by capping layer, In-0.35 Ga-0.65 As template and GaAs substrate layers were obtained from well-fitted PzR spectra using the first or third derivative of a Lorentz line shape. Differences between PzR results of two samples were discussed qualitatively.
引用
收藏
页码:4934 / 4939
页数:6
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