Magnetic tunnel junction based eddy current testing probe for detection of surface defects

被引:15
|
作者
Cardoso, F. A. [1 ,2 ]
Rosado, L. [3 ,4 ,5 ]
Ferreira, R. [6 ]
Paz, E. [6 ]
Cardoso, S. [1 ,2 ]
Ramos, P. M. [3 ,5 ]
Piedade, M. [3 ,4 ]
Freitas, P. P. [1 ,2 ,6 ]
机构
[1] INESC MN, P-1000029 Lisbon, Portugal
[2] IN Inst Nanosci & Nanotechnol, P-1000029 Lisbon, Portugal
[3] Univ Lisbon, Inst Super Tecn, P-1049001 Lisbon, Portugal
[4] INESC IDInst Engn Sistemas & Comp Invest & Desenv, P-1000029 Lisbon, Portugal
[5] IT Inst Telecomunicacoes, P-1049001 Lisbon, Portugal
[6] Int Iberian Nanotechnol Lab INL, P-4715330 Braga, Portugal
基金
欧盟第七框架计划;
关键词
D O I
10.1063/1.4864045
中图分类号
O59 [应用物理学];
学科分类号
摘要
In recent years, magnetoresistive sensors have been applied to a large spectrum of applications from biomedical devices to industrial devices. Their high sensitivity and high spatial resolution are of special interest for eddy current based non-destructive testing. In this particular application, giant magnetoresistive sensors have been recently used for detecting surface and buried defects. Nevertheless, although very promising, magnetic tunnel junctions (MTJs) are still barely used in this application. In this work, two sensors with 6 and 10 MTJs in series were successfully fabricated, characterized, and tested on an aluminum mock-up including defects 100 mu m wide and with a depth ranging from 0.2 to 1 mm. The sensors including 6 MTJ in series showed sensitivities of 50.8 mV/mT, while the sensor with 10 MTJ in series showed a sensitivity of 84.5 mV/mT. Due to its high sensitivity the latter was able to detect the smallest defect with a signal to noise ratio of 50, which seems promising for more challenging applications. (C) 2014 AIP Publishing LLC.
引用
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页数:3
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