Effect of magnetic field strength on beam intensity of highly charged Xe ions from liquid-He-free superconducting electron cyclotron resonance ion source

被引：2
|
作者：
Imanaka, M [1 ]
Kurita, T
Tukada, M
Nakagawa, T
Kidera, M
Lee, SM
机构：
[1] Univ Tsukuba, Inst Phys, Tsukuba, Ibaraki 3058577, Japan
[2] RIKEN, Wako, Saitama 3510198, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 6A期
关键词：
electron cyclotron resonance ion source; liquid-He-free; magnetic field strength; aluminum cylinder; highly charged Xe ions;
D O I：
10.1143/JJAP.41.3926
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have tested the effect of magnetic field strength of beam extraction side on the beam intensity of highly charged Xe ions produced front liquid-He-free superconducting, electron cyclotron resonance ion source. We observed that the beam intensities of highly charged Xe ions are strongly dependent on the magnetic field strength. The beam intensities of highly charged Xe ions, such as 32+ and 33+, increase with increasing magnetic field strength from 1 to 1.24T. At 1.24T, we successfully obtained beam intensities of 6 and 4 emuA for Xe32and33+ ions, respectively.
引用
收藏
页码：3926 / 3929
页数：4
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    Institute of Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan
    不详
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2002, 41 (6 A): : 3926 - 3929
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