High Throughput Laser Processing with Ultra-Short Pulses by High Speed Line-Scanning in Synchronized Mode

被引：0
|
作者：
Neuenschwander, B. [1 ]
Jaeggi, B. [1 ]
Zimmermann, M. [1 ]
Penning, L. [2 ]
deLoor, R. [2 ]
机构：
[1] Bern Univ Appl Sci, Inst Appl Laser Photoncis & Surface Technol, Pestalozzistr 20, CH-3400 Burgdorf, Switzerland
[2] Next Scan Technol, NL-7064 BD Silvolde, Netherlands
来源：
2014 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2014年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Maintaining excellent processing quality with high power ultrafast lasers demands new and fast beam deflecting systems. We present our latest results obtained with a fast polygon line scanner synchronized with a picosecond and femtosecond laser.
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页数：2
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