Eliminate thermoelectric EMF in low-ohm measurements

被引:0
|
作者
Wynne, J [1 ]
机构
[1] Analog Devices Inc, Limerick, Ireland
关键词
Electric excitation - Electric impedance - Electric variables measurement - Error detection - Problem solving - Thermoelectricity - Transistors - Voltage control;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Elimination of thermoelectric electromagnetic fields (EMF) that causes errors in the readings while trying to measure small voltages or low impedance are discussed. A standard way to solve this problem is subsequently averaging the two readings by reversing the excitations. An increase in excitation current increases the measurement sensitivity , the two internal 200-μA excitation currents appear in parallel with each other. Port pins P1 and P2 of the AD7719 drive the transistors in antiphase mode.
引用
收藏
页码:98 / +
页数:2
相关论文
共 50 条
  • [1] SYNCHRONOUS DETECTOR FOR A LOW-OHM LOAD.
    Kovalev, A.E.
    Buznikov, A.A.
    Glagolev, S.F.
    Kel'man, A.M.
    Instruments and Experimental Techniques (English Translation of Pribory I Tekhnika Eksperimenta), 1973, 16 (5 Part 2): : 1479 - 1480
  • [2] MULTIPLE BREAKDOWN IN A PEAKING BREAK OF A LOW-OHM LINE
    AFONIN, IP
    BABYKIN, MV
    BARTOV, AV
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1971, 14 (02): : 487 - &
  • [3] Technology and Tooling to Manufacture Low-Ohm (< 2 nΩ) Electrical Joints of the ITER PF1 Coil
    Bondarenko, V. I.
    Egorov, B. I.
    Klimchenko, Yu. A.
    Kovalchuk, O. A.
    Marushin, E. L.
    Mednikov, A. A.
    Rodin, I. Yu.
    Yarota, V. M.
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2013, 23 (03)
  • [4] THERMOELECTRIC MEASUREMENTS AT LOW TEMPERATURES
    MOOSER, E
    PEARSON, WB
    TEMPLETON, IM
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (08) : C161 - C162
  • [5] THERMOELECTRIC MEASUREMENTS ON NATURAL GALENA AT LOW TEMPERATURES
    FINLAYSON, DM
    GREIG, D
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1959, 73 (469): : 49 - 53
  • [6] THERMOELECTRIC EMF OF TIN-CADMIUM ALLOYS
    CHARNOCK, H
    YEO, SA
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1959, 36 (11): : 478 - 479
  • [7] NEW NBS MEASUREMENTS OF ABSOLUTE FARAD AND OHM
    CUTKOSKY, RD
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1974, IM23 (04) : 305 - 309
  • [8] A comparison of the prototype standard measurements of the international ohm
    Jouaust, R
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES, 1922, 175 : 94 - 96
  • [9] THERMOELECTRIC MEASUREMENTS ON TUNGSTEN AT ULTRA LOW-TEMPERATURES
    STONE, EL
    EWBANK, MD
    PRATT, WP
    BASS, J
    PHYSICS LETTERS A, 1976, 58 (04) : 239 - 241
  • [10] INSERTION LOSS MEASUREMENTS IN A 5 OHM SYSTEM
    BERNSTEI.SS
    IEEE ELECTROMAGNETIC COMPATIBILITY SYMPOSIUM RECORD, 1969, (11): : 111 - &