Buffer layer-less fabrication of a high-mobility transparent oxide semiconductor, La-doped BaSnO3

被引:22
|
作者
Sanchela, Anup, V [1 ]
Wei, Mian [2 ]
Lee, Joonhyuk [3 ]
Kim, Gowoon [3 ]
Jeen, Hyoungjeen [3 ]
Feng, Bin [4 ]
Ikuhara, Yuichi [4 ]
Cho, Hai Jun [1 ,2 ]
Ohta, Hiromichi [1 ,2 ]
机构
[1] Hokkaido Univ, Res Inst Elect Sci, Kita Ku, N20W10, Sapporo, Hokkaido 0010020, Japan
[2] Hokkaido Univ, Grad Sch Informat Sci & Technol, Kita Ku, N14W9, Sapporo, Hokkaido 0600814, Japan
[3] Pusan Natl Univ, Dept Phys, Busan 46241, South Korea
[4] Univ Tokyo, Inst Engn Innovat, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1138656, Japan
基金
日本学术振兴会;
关键词
ELECTRONIC-STRUCTURE;
D O I
10.1039/c8tc06177g
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
La-Doped BaSnO3 (LBSO) is one of the most promising transparent oxide semiconductors because its single crystal exhibits high electron mobility; therefore, it has drawn significant attention in recent years. However, in the LBSO films, it is very hard to obtain high mobility due to threading dislocations, which are caused by the lattice mismatch between the film and the substrate. While previous studies have reported that insertion of buffer layers increases the electron mobilities; this approach leaves much to be desired since it involves a two-step film fabrication process, and the enhanced mobility values are still significantly lower than the single crystal values. Thus, herein, we show that the electron mobility of the LBSO films can be improved without the insertion of any buffer layers if the films are grown under highly oxidative ozone (O-3) atmospheres. The O-3 environment relaxes the LBSO lattice and reduces the formation of the Sn2+ states, which are known to suppress the electron mobility in LBSO. The resultant O-3-LBSO films show improved mobility values up to 115 cm(2) V-1 s(-1), which are among the highest values reported for the LBSO films on SrTiO3 substrates and comparable to those of the LBSO films with buffer layers.
引用
收藏
页码:5797 / 5802
页数:6
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