Analysis of consecutive k-out-of-n: F systems with single repair facility

被引：0

作者：

Kumar, UD ^{[1
]}

Gopalan, MN ^{[1
]}

机构：

[1] INDIAN INST TECHNOL,DEPT MATH,BOMBAY 400076,MAHARASHTRA,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1997年 / 37卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a consecutive k-out-of-n : F system with non-identical units and with a single repair facility is analyzed in connection with the reliability and availability of the system. The failure rates of the units are constant and the repair time is arbitrarily distributed. A mathematical model is developed using semi-regenerative phenomena and systems of convolution integral equations satisfied by various state probabilities corresponding to different initial conditions are obtained. A particular case with k = 2 and n = 3 is analyzed numerically to study the effect of various parameters on the availability and reliability of the system. Copyright (C) 1996 Elsevier Science Ltd.

引用

页码：587 / 590

页数：4

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