Towards a unified test process: From UML to end-of-line functional test

被引：3
|
作者：
Baldini, A [1 ]
Benso, A [1 ]
Prinetto, P [1 ]
机构：
[1] Politecn Torino, Dipartimento Automat & Informat, I-10129 Turin, Italy
来源：
INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS | 2001年
关键词：
D O I：
10.1109/TEST.2001.966679
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, we propose the use of a UML methodology, to go from user requirements and specifications to end of production testing of complex embedded systems. We consider behavioral, structural and physical levels building a comprehensive and modular model. The process contains the definition of a set of properties being created and then updated in each phase, and heavily, relies on message passing and elaborating facilities to increase both abstraction and descriptive power. Result of the process is test pattern generation using custom ATE commands. We also present and discuss an underdevelopment case study of a significantly complex automotive application.
引用
收藏
页码：600 / 608
页数：9
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