Thermal performance of a phase change material on a nickel-plated surface

被引:13
|
作者
Nurmawati, MH
Siow, KS
Rasiah, IJ [1 ]
机构
[1] Honeywell Pte Ltd, Honeywell Elect Mat, Singapore, Singapore
[2] Natl Univ Singapore, Dept Chem, Singapore 117548, Singapore
关键词
thermal resistance; thermal interface material; phase change material; Ni-plated Cu;
D O I
10.1016/j.tsf.2004.05.114
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thermal control becomes increasingly vital with IC chips becoming faster and smaller. The need to keep chips within acceptable operating temperatures is a growing challenge. Thermal interface materials (TIM) form the interfaces that improve heat transfer from the heat-generating chip to the heat dissipating thermal solution. One of the most commonly used materials in today's electronics industry is phase change material (PCM). Typically, the heat spreader is a nickel-plated copper surface. The compatibility of the PCM to this surface is crucial to the performance of the TIM. In this paper, we report on the performance of this interface. To that end, an instrument to suitably measure critical parameters, like the apparent and contact thermal resistance of the TIM, is developed according to the ASTM D5470 and calibrated. A brief theory of TIM is described and the properties of the PCM were investigated using the instrument. Thermal resistance measurements were made to investigate the effects of physical parameters like pressure, temperature and supplied power on the thermal performance of the material on nickel-plated surface. Conclusions were drawn on the effectiveness of the interface and their application in IC packages. (C) 2004 Published by Elsevier B.V.
引用
收藏
页码:481 / 486
页数:6
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