Defect detection in multilayer ceramic capacitors

Cracks in Multilayer Capacitors are often latent defects, which are not recognized in production, but can cause substantial problems in field. Therefore it is important to find possibilities to detect those candidates before delivering electronic equipment. In this work, cracked capacitors were characterized by electrical parameter testing and by piezoelectric spectroscopy. As a new method, sound emission spectroscopy was employed as indicator for latent defects and correlated with electrical data and physical analysis. The results show that sound emission used on a statistical basis and piezoelectric response might be effective to screen latent defects in electronic control units.