Inelastic electron-tunneling spectroscopy of nanoporous gold films

被引：4

作者：

Liu, H. W. ^{[1
]}

Nishitani, R. ^{[2
]}

Fujita, T. ^{[3
,4
]}

Li, W. ^{[5
]}

Zhang, L. ^{[3
]}

Lang, X. Y. ^{[3
]}

Richard, P. ^{[6
]}

Nakayama, K. S. ^{[3
]}

Chen, X. ^{[5
]}

Chen, M. W. ^{[3
]}

Xue, Q. K. ^{[3
,5
,6
]}

机构：

[1] Chinese Acad Sci, Inst Phys, Beijing 100190, Peoples R China

[2] Kyushu Inst Technol, Dept Basic Sci, Fukuoka 8048550, Japan

[3] Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan

[4] JST, PRESTO, Kawaguchi, Saitama 3320012, Japan

[5] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China

[6] Collaborat Innovat Ctr Quantum Matter, Beijing, Peoples R China

来源：

PHYSICAL REVIEW B | 2014年 / 89卷 / 03期

基金：

美国国家科学基金会;

关键词：

ENHANCED RAMAN-SCATTERING; PHOTON-EMISSION; CHARACTERISTIC LENGTH; EXCITATION; SCALE;

D O I：

10.1103/PhysRevB.89.035426

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigated the localized electronic properties of nanoporous gold films by using an ultrahigh vacuum scanning tunneling microscope at low temperature (4.2 K). Second derivative scanning tunneling spectroscopy shows the plasmon peaks of the nanoporous gold films, which are excited by inelastic tunneling electrons. We propose that the nanorod model is appropriate for nanoporous gold studies at the nanometer scale. These results are supported by a three-dimensional electron tomography analysis and theoretical calculations of nanoporous gold with an ellipsoidal shape.

引用

页数：5

共 50 条

[1] INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
KIRTLEY, J
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1979, (SEP): : 112 - 112
[2] INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
KHANNA, SK
LAMBE, J
[J]. SCIENCE, 1983, 220 (4604) : 1345 - 1351
[3] INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
JAKLEVIC, RC
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1981, 181 (MAR): : 175 - ANYL
[4] INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
EWERT, S
[J]. FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS, 1984, 24 : 73 - 91
[5] CHARACTERIZATION OF EVAPORATED SILICON FILMS BY INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
HIGO, M
NISHINO, K
KAMATA, S
[J]. APPLIED SURFACE SCIENCE, 1991, 51 (1-2) : 61 - 69
[6] INELASTIC ELECTRON-TUNNELING SPECTROSCOPY OF THIN ZNO BARRIER FILMS
REFAI, TF
WOLF, EL
[J]. THIN SOLID FILMS, 1983, 99 (04) : 345 - 350
[7] CHARACTERIZATION OF EVAPORATED GERMANIUM FILMS BY INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
HIGO, M
ISOBATA, M
KAMATA, S
[J]. APPLIED SURFACE SCIENCE, 1992, 59 (3-4) : 219 - 226
[8] CHARACTERIZATION OF EVAPORATED SI AND SIO FILMS BY INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
HIGO, M
NISHINO, K
KAMATA, S
[J]. JOURNAL OF PHYSICAL CHEMISTRY, 1992, 96 (04): : 1848 - 1854
[9] RECENT ADVANCES IN INELASTIC ELECTRON-TUNNELING SPECTROSCOPY
HANSMA, PK
KIRTLEY, J
[J]. ACCOUNTS OF CHEMICAL RESEARCH, 1978, 11 (12) : 440 - 445
[10] INELASTIC ELECTRON-TUNNELING SPECTROSCOPY OF CHEMISORBED SUBSTANCES
CHU, HT
EIB, NK
GENT, AN
HENRIKSEN, PN
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1977, 174 (SEP): : 27 - 27

← 1 2 3 4 5 →