One-Port Time Domain Measurement Technique for Quality Factor Estimation of Loaded and Unloaded Cavities

被引：0

作者：

Green, David L. ^{[1
]}

Rajamani, Vignesh ^{[1
]}

Bunting, Charles F. ^{[1
]}

Archambeault, Bruce ^{[1
]}

Connor, Samuel ^{[1
]}

机构：

[1] Oklahoma State Univ, Sch Elect & Comp Engn, Stillwater, OK 74078 USA

来源：

2013 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2013年

关键词：

quality factor; one-port measurement; reverberation chamber; loaded cavity;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper a one-port time domain measurement technique for quality factor estimation of a loaded and unloaded metallic cavity is presented. By observing the power decay profile of S-11 the quality factor can be computed. Validation of the one-port time domain technique is done by comparing quality factor estimation with the Q estimations from both two-port frequency and time domain data. The usefulness of the one-port time domain technique is also demonstrated using a physically small but electrically large cavity with different types of RF absorber material.

引用

页码：747 / 750

页数：4

共 18 条

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