In Situ X-ray Diffraction Study on the Orientation-Dependent Thermal Expansion of Cu Nanowires

被引：16
|
作者：
Zhou, Wen Fei
Fei, Guang Tao [1 ]
Li, Xin Feng
Xu, Shao Hui
Chen, Li
Wu, Bing
De Zhang, Li
机构：
[1] Chinese Acad Sci, Hefei Inst Phys Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China
来源：
JOURNAL OF PHYSICAL CHEMISTRY C | 2009年 / 113卷 / 22期
基金：
中国国家自然科学基金;
关键词：
ARRAYS; GROWTH;
D O I：
10.1021/jp900047q
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Cu nanowires with different preferred orientations were successfully fabricated in porous anodic alumina membrane (PAAM) templates by an electrochemical method. Thermal expansion of as-prepared and annealed samples embedded in PAAM templates was studied by in situ X-ray diffraction (XRD) measurement in the temperature range from 25 to 800 degrees C. For the as-prepared samples, the coefficients of thermal expansion (CTEs) of the (111), (200), and (220) planes are (7.85 +/- 0.10) x 10(-6)/degrees C, (2.91 +/- 0.08) x 10(-6)/degrees C, and (3.40 +/- 0.05) x 10(-6)/degrees C, respectively. The CTEs of annealed samples are (5.88 +/- 0.10) x 10(-6)/degrees C, (5.76 +/- 0.08) x 10(-6)/degrees C, and (5.71 +/- 0.05) x 10(-6)/degrees C, corresponding to the (111), (200), and (220) planes, respectively. The changes of vacancy configurations in XRD heating measurement are responsible for the orientation-dependent thermal expansion of as-prepared and annealed samples.
引用
收藏
页码：9568 / 9572
页数：5
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