Micro and nano bubbles on polystyrene film/water interface

被引:19
|
作者
Li, Dayong [1 ,2 ]
Zhao, Xuezeng [1 ]
机构
[1] Harbin Inst Technol, Sch Mech & Elect Engn, Harbin 150001, Peoples R China
[2] Heilongjiang Univ Sci & Technol, Sch Mech Engn, Harbin 150022, Peoples R China
关键词
Surface nanobubbles; Contact angle; Size dependence; Atomic force microscope (AFM); SURFACE NANOBUBBLES; CONTACT ANGLES; LINE TENSION; HYDROPHOBIC SURFACES; WATER; STABILITY; NUCLEATION;
D O I
10.1016/j.colsurfa.2014.06.022
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Surface bubbles at polystyrene (PS) film/water interface were imaged using the atomic force microscope (AFM), the surface roughness ranged from 0.58 nm to 3.36 nm in scan area of 5 mu m(2). Big microbubble with a lateral size up to 13 mu m and a height up to 400 nm was reported. The possible reasons for nucleation of big microbubbles were investigated and found that surface roughness and surface properties play a significant role. Further, we focused on the problem "how does the contact angle (measured through air) rely on the bubble size" in a lateral size of 200 nm to 13 mu m, which is the largest size scale for surface bubbles found so far. It was found that the dependence of contact angle on lateral size theta(2r) and height theta(h) is linear for bubbles on smooth substrates, but nonlinear and even keep constant with the increase of bubble size for bubbles on rough substrates. While studying the dependence of contact angle on curvature radius theta(R-c), an inversion in direction between the bubbles in different size scale was found. The results obtained were in close resemblance with the results of other studies. The line tension of surface bubbles on the seven PS substrates in our experiments was calculated and all of the seven line tension values are negative (the average line tension in this study was tau approximate to -1.07 nN), which should be responsible for the anomalous low contact angle and the size-dependence of the surface bubbles. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:128 / 135
页数:8
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