Identification of wheat grain in different states based on hyperspectral imaging technology

Nondestructive identification of wheat grains in different states plays an important role in improving the quality of wheat products. This study investigated the possibility of using hyperspectral imaging techniques to discriminate healthy wheat grain, germinated wheat grain, mildewed wheat grain, and shriveled wheat grain (wheat grain infected with fusarium head blight). Both sides of individual wheat kernels were subjected to hyperspectral imaging (866.4-1701.0 nm) to acquire hyperspectral cube data. Spectral data were preprocessed by using standardization and multiple scattering correction. In addition, the principal component loading method was used to extract the characteristic wavelengths of both sides of wheat grains. The sample is divided into calibration set, test set, and validation set. The data of the calibration set are used to train the partial least squares discriminant analysis model, K-nearest neighbor model, and the support vector machine model, and the test set data are used to test the model. The results show that spectral data of both sides can achieve good classification results, while the reverse spectral data perform better. By comparing with each other, the support vector machine model is selected as the best classification model. Finally, using two hyperspectral images (reverse side) that are not involved in training and testing to verify the accuracy of the established support vector machine model, and the classification effect maps of the four wheat grains were visualized. The results indicate that nondestructive classification of wheat grains in different states is feasible based on hyperspectral imaging technology.