Reactivity of rhodium during co-deposition of rhodium and carbon

被引:9
|
作者
Marot, Laurent [1 ]
Steiner, Roland [1 ]
De Temmerman, Gregory
Oelhafen, Peter [1 ]
机构
[1] Univ Basel, Dept Phys, CH-4056 Basel, Switzerland
基金
英国工程与自然科学研究理事会;
关键词
X-RAY PHOTOEMISSION; SPECTRA; PEAK;
D O I
10.1016/j.jnucmat.2009.01.266
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The detailed characterizations of rhodium/carbon films prepared by co-deposition using a dual magnetron sputtering have been carried out on silicon substrates at room temperature. Effects of the carbon incorporated in the film on the chemical bonding state, optical reflectivity and crystallinity were investigated using XPS, reflectivity measurements, XRD and SEM. The incorporation of carbon changes the films' crystallinity and thus producing amorphous films. The reflectivity of the films decreases linearly as the rhodium concentration decreases. It is important to note that no chemical bonding was observed between rhodium and carbon whatever the deposition conditions, even at high deposition temperature. Concerning the reactivity of rhodium films with oxygen, after long term storage in air the rhodium surface is covered with a thin rhodium oxide (few nanometers). However, for these films no variation of the optical reflectivity was observed after long air storage. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:1135 / 1137
页数:3
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