FPGA Based Skin Disease Identification System Using Sift Algorithm and K-NN

被引:1
|
作者
Mendoza, Joshua D. B. [1 ]
Linsangan, Noel B. [1 ]
Torres, Jumelyn L. [1 ]
Villanueva, Emmanuel Luis D. [1 ]
机构
[1] Mapua Univ, Sch Elect Elect & Comp Engn, Muralla St, Manila 1002, Philippines
关键词
Biopsy; SIFT algorithm; K-Nearest Neighbor (K-NN); local features; skin disease identification; pathological; visual inspection; specialists;
D O I
10.1117/12.2572951
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
The initial assessment of any skin disease is usually made by visual inspection of doctors and skin specialists. Further tests may be recommended such as biopsy and pathological examination for a more accurate diagnosis. With the use of skin disease identification system, the diagnosis of infected skin is readily attainable without undergoing biopsy and pathological examination. The infected skin disease image is identified using SIFT algorithms with local features and K-NN classifier. The skin disease that will be identified are acne, psoriasis, eczema, rashes, hives, warts, tinea versicolor (an-an) and unknown skin disease. The system was confirmed to be efficient in identifying the aforementioned skin diseases. Identification of infected skin images is accomplished by K-Nearest Neighbors (K-NN) algorithm which shows an accuracy of 90% in functionality testing.
引用
收藏
页数:11
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