Pico-Femto-Attosecond Metrology for Advanced and XUV Photon Sources

被引：0
|
作者：
Sinyakova, T. [1 ]
Bomme, C. [2 ]
Cubaynes, D. [1 ]
Bourassin-Bouchet, C. [3 ]
Gharbi, A. [1 ]
Garcia, G. [4 ]
Pandey, A. K. [5 ]
Papagiannouli, I [5 ]
Guilbaud, O. [5 ]
Klisnick, A. [1 ]
机构：
[1] Paris Sud Univ, ISMO, CNRS, Orsay, France
[2] CEA Saclay, LIDYL, Saclay, France
[3] Inst Opt, LCF, Palaiseau, France
[4] Synchrotron SOLEIL, St Aubin, France
[5] Paris Sud Univ, CNRS, LPGP, Orsay, France
来源：
X-RAY LASERS 2018 | 2020年 / 241卷
关键词：
X-RAY LASER;
D O I：
10.1007/978-3-030-35453-4_24
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a new Velocity Map Imaging (VMI) spectrometer based on the thick-lens configuration to be implemented at different XUV source beamlines to realize the measurements of the pulse temporal structure using the technique of laser-dressed photoionization.
引用
收藏
页码：163 / 168
页数：6
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