Profiting From IoT: The Key Is Very-Large-Scale Happiness Integration

被引：0

作者：

Yano, Kazuo ^{[1
]}

Akitomi, Tomoaki ^{[1
]}

Ara, Koji ^{[1
]}

Watanabe, Junichiro ^{[1
]}

Tsuji, Satomi ^{[1
]}

Sato, Nobuo ^{[1
]}

Hayakawa, Miki ^{[1
]}

Moriwaki, Norihiko ^{[1
]}

机构：

[1] Hitachi Ltd, Res & Dev Grp, Kokubunji, Tokyo 185, Japan

来源：

2015 SYMPOSIUM ON VLSI TECHNOLOGY (VLSI TECHNOLOGY) | 2015年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Big data without link to value is merely a cost. We have studied how to profit from data with Internet-of-Things technologies for over 10 years to reach the answer: the Wearable Happiness Meter. It allows us to integrate the measure of both wellbeing and productivity of 7-billion people worldwide, which was the dream of the 18th-century philosopher Jeremy Bentham, numeration of the greatest happiness of the greatest number to measure the right and wrong. Knowing right and wrong with the 10x speed over conventional financial feedback accelerates the growth of the enterprise, the economy, and the individual to maximize the worldwide happiness. Here the integration is not only on a chip, but in the distributed massive chips embedded in the society.

引用

页数：4

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[1] Profiting From IoT: The Key Is Very-Large-Scale Happiness Integration
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Akitomi, Tomoaki
Ara, Koji
Watanabe, Junichiro
Tsuji, Satomi
Sato, Nobuo
Hayakawa, Miki
Moriwaki, Norihiko
2015 SYMPOSIUM ON VLSI CIRCUITS (VLSI CIRCUITS), 2015,
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