XRD Study of Strongly Textured and Stressed Thin Films

被引：0
|
作者：
Kuzel, Radomir [2 ]
Simek, Daniel [1 ]
机构：
[1] Acad Sci Czech Republ, Inst Phys, Prague, Czech Republic
[2] Charles Univ Prague, Fac Math & Phys, Prague, Czech Republic
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2005年 / 61卷
关键词：
powder diffraction; reciprocal space mapping; thin films;
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P.12.11.10
引用
收藏
页码：C415 / C415
页数：1
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