Self-leveling uncooled microcantilever thermal detector

被引:52
|
作者
Corbeil, JL
Lavrik, NV
Rajic, S
Datskos, PG [1 ]
机构
[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
[2] Univ Tennessee, Knoxville, TN 37996 USA
关键词
D O I
10.1063/1.1498870
中图分类号
O59 [应用物理学];
学科分类号
摘要
Bimaterial microcantilevers can be used as highly sensitive uncooled infrared (IR) detectors. Since the transduction efficiency of microcantilevers depends on their deflection, it is important to minimize cantilever deflections caused by factors other than IR radiation (e.g., intrinsic mechanical stresses and ambient temperature fluctuations). In this letter we report on a design of a microcantilever IR detector that is immune to ambient temperature changes and other sources of interfering mechanical stresses. We modeled and experimentally measured responses of such devices to IR radiation as well as to ambient temperature changes. Both modeling and experimental results indicate that the implemented innovative designs can combine excellent IR sensitivity with negligible sensitivity to the ambient temperature changes. (C) 2002 American Institute of Physics.
引用
收藏
页码:1306 / 1308
页数:3
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