Control of the higher eigenmodes of a microcantilever: Applications in atomic force microscopy

被引:10
|
作者
Karvinen, K. S. [1 ]
Moheimani, S. O. R. [1 ]
机构
[1] Univ Newcastle, Sch Elect Engn & Comp Sci, Callaghan, NSW 2308, Australia
关键词
Atomic force microscopy; Amplitude modulation; Tapping mode; Contact mode; Liquid; Multifrequency; Microcantilever; Q control; High-frequency; Higher eigenmodes; Modulated-demodulated control; HIGHER HARMONICS; MODE; CANTILEVERS;
D O I
10.1016/j.ultramic.2013.11.011
中图分类号
TH742 [显微镜];
学科分类号
摘要
While conventional techniques in dynamic mode atomic force microscopy typically involve the excitation of the first flexural mode of a microcantilever, situations arise where the excitation of higher modes may result in image artefacts. Strong nonlinear coupling between the cantilever modes in liquid environments may result in image artefacts, limiting the accuracy of the image. Similar observations have been made in high-speed contact mode AFM. To address this issue, we propose the application of the modulated-demodulated control technique to attenuate problematic modes to eliminate the image artefacts. The modulated-demodulated control technique is a high-bandwidth technique, which is well suited to the control of next generation of high-speed cantilevers. In addition to potential improvements in image quality, a high-bandwidth controller may also find application in multifrequency AFM experiments. To demonstrate the high-bandwidth nature of the control technique, we construct an amplitude modulation AFM experiment in air utilizing low amplitude setpoints, which ensures that harmonic generation and nonlinear coupling of the modes result in image artefacts. We then utilize feedback control to highlight the improvement in image quality. Such a control technique appears extremely promising in high-speed atomic force microscopy and is likely to have direct application in AFM in liquids. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:66 / 71
页数:6
相关论文
共 50 条
  • [1] Microcantilever dynamics in tapping mode atomic force microscopy via higher eigenmodes analysis
    Andreaus, Ugo
    Placidi, Luca
    Rega, Giuseppe
    [J]. JOURNAL OF APPLIED PHYSICS, 2013, 113 (22)
  • [2] Microcantilever dynamics in liquid environment dynamic atomic force microscopy when using higher-order cantilever eigenmodes
    Kiracofe, Daniel
    Raman, Arvind
    [J]. JOURNAL OF APPLIED PHYSICS, 2010, 108 (03)
  • [3] Fluidic applications for atomic force microscopy (AFM) with microcantilever sensors
    Kim, Seonghwan
    Kihm, Kenneth D.
    Thundat, Thomas
    [J]. EXPERIMENTS IN FLUIDS, 2010, 48 (05) : 721 - 736
  • [4] Fluidic applications for atomic force microscopy (AFM) with microcantilever sensors
    Seonghwan Kim
    Kenneth D. Kihm
    Thomas Thundat
    [J]. Experiments in Fluids, 2010, 48 : 721 - 736
  • [5] On contribution and detection of higher eigenmodes during dynamic atomic force microscopy
    Saraswat, Govind
    Salapaka, Murti V.
    [J]. APPLIED PHYSICS LETTERS, 2013, 102 (17)
  • [6] Design and Analysis of Piezoelectric Cantilevers with Enhanced Higher Eigenmodes for Atomic Force Microscopy
    Moore, Steven I.
    Ruppert, Michael G.
    Yong, Yuen K.
    [J]. 2017 IEEE INTERNATIONAL CONFERENCE ON ADVANCED INTELLIGENT MECHATRONICS (AIM), 2017, : 719 - 724
  • [7] Multi-Mode Resonant Control of a Microcantilever for Atomic Force Microscopy
    Ruppert, Michael G.
    Fairbairn, Matthew W.
    Moheimani, S. O. Reza
    [J]. 2013 IEEE/ASME INTERNATIONAL CONFERENCE ON ADVANCED INTELLIGENT MECHATRONICS (AIM): MECHATRONICS FOR HUMAN WELLBEING, 2013, : 77 - 82
  • [8] The Control of Higher Modes in Atomic Force Microscopy
    Karvinen, K. S.
    Moheimani, S. O. R.
    [J]. 2014 INTERNATIONAL CONFERENCE ON NANOSCIENCE AND NANOTECHNOLOGY (ICONN), 2014, : 65 - 66
  • [9] Experimental analysis of tip vibrations at higher eigenmodes of QPlus sensors for atomic force microscopy
    Ruppert, Michael G.
    Martin-Jimenez, Daniel
    Yong, Yuen K.
    Ihle, Alexander
    Schirmeisen, Andre
    Fleming, Andrew J.
    Ebeling, Daniel
    [J]. NANOTECHNOLOGY, 2022, 33 (18)
  • [10] Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes
    Stark, RW
    Drobek, T
    Heckl, WM
    [J]. APPLIED PHYSICS LETTERS, 1999, 74 (22) : 3296 - 3298