Impact of 4H- and 6H-SiC(0001) nitridation on Ga wetting layer development and GaN growth by molecular beam epitaxy

被引:5
|
作者
Kim, Tong-Ho [1 ]
Choi, Soojeong
Brown, April S.
Losurdo, Maria
Bruno, Giovanni
机构
[1] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA
[2] CNR, IMIP, Inst Inorgan Methodol & Plasmas, I-70126 Bari, Italy
[3] INSTM UdR Bari, I-70126 Bari, Italy
关键词
D O I
10.1063/1.2220007
中图分类号
O59 [应用物理学];
学科分类号
摘要
GaN epitaxial layers have been grown by plasma-assisted molecular beam epitaxy on Si-face 4H- and 6H-SiC(0001)(Si) substrates. The impact of the SiC surface preparation and oxide removal achieved via a Ga flash-off process followed by nitridation on the structure and properties of GaN epitaxial layers is articulated. A correlation among the SiC surface nitridation conditions, the Ga wetting layer development, the nucleation layer, and GaN crystalline properties is revealed. (c) 2006 American Institute of Physics.
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页数:3
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