Test results of a self-triggering silicon strip detector readout chip

被引:0
|
作者
Kasinski, Krzysztof [1 ]
Szczygiel, Robert [1 ]
Czermak, Adam [2 ]
机构
[1] AGH Univ Sci & Technol, Krakow, Poland
[2] Inst Nucl Phys, Krakow, Poland
关键词
Multichannel ASIC; Silicon strip detector; SSD;
D O I
10.1016/j.nima.2009.03.167
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The n-XYter integrated circuit (ASIC) was designed in a CMOS 0.35 mu m technology, as a 128-channel, data-driven silicon detector readout chip and became a prototype readout chip for several experiments at the Facility for Antiproton and Ion Research (FAIR). The details of the circuit architecture have already been published [C. Schmidt, et al., in: Proceedings of the Topical Workshop on Electronics for Particle Physics, Prague, Czech Republic, 03-07 September 2007; A. Brogna, et al., Nucl. Instr. and Meth. A 568 (2006) 301]. In this paper we present test results on discriminator threshold spread and its correction, analogue front-end gain measurements and calibration of the time-stamp circuitry. The measurements were performed using on-chip test pulses. The ASIC was connected to a 1 cm long, 100 mu m pitch, AC-coupled silicon strip detector (SSD). (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:244 / 246
页数:3
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