Reflection and Transmission of Focused Light Beam at a Dielectric Interface

被引：0
|
作者：
Petrov, N., I [1 ]
机构：
[1] Russian Acad Sci, Sci & Technol Ctr Unique Instrumentat, 15 Butlerova Str, Moscow 117342, Russia
来源：
OPTICAL TECHNOLOGIES FOR TELECOMMUNICATIONS 2019 | 2020年 / 11516卷
基金：
俄罗斯基础研究基金会;
关键词：
reflection and transmission; dielectric interface; focused beam; propagating and evanescent fields; GAUSSIAN BEAMS; POLARIZATION; DISPLACEMENT; VECTOR; PHASE; DIFFRACTION; WAVE;
D O I：
10.1117/12.2566490
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The reflection and transmission of TE and TM polarized extremely narrow wave beams which are oblique incident on the dielectric interface are analyzed. Disappearance of the Brewster angle and total internal reflection effects for the strongly focused beams is predicted. The change in beam profile after reflection and transmission for different polarizations, incident beam spots and incidence angles is analyzed. Experiments using NSOM (near-field scanning optical probe) fiber probe with an aperture diameter 50 nm are conducted. It is demonstrated that substantial output light intensity increase occurs at the probe end/glass plate interface.
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页数：10
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