Application of photoemission electron microscopy to magnetic domain imaging

被引：0
|
作者：
Kinoshita, T [1 ]
机构：
[1] Univ Tokyo, Inst Solid State Phys, Synchrotron Radiat Lab, Tsukuba, Ibaraki 3050801, Japan
来源：
NANOSCALE SPECTROSCOPY AND ITS APPLICATIONS TO SEMICONDUCTOR RESEARCH | 2002年 / 588卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Application examples of photoemission electron microscopy (PEEM) are reviewed. Especially, the combination of PEEM and X-ray magnetic dichroism spectroscopy is very valuable for magnetic domain imaging. According to the demands from industrial usage, such as production of magnetic recording media etc., the application method becomes much important. In this review, several examples of the studies using magnetic circular and/or linear dichroism spectroscopy for ferro- and antiferromagnetic materials are introduced.
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页码：145 / 156
页数：12
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