Fault Diagnosis in Analog Electrical Circuits: Data-Driven Method

被引：0
|
作者：
Zhirabok, A. [1 ]
Baranov, A. [1 ]
机构：
[1] Far Eastern Fed Univ, Dept Automat & Control, Sukhanova St 8, Vladivostok, Russia
来源：
2013 INTERNATIONAL CONFERENCE ON PROCESS CONTROL (PC) | 2013年
关键词：
electrical circuit; linear models; polynomial models; fault detection; data-driven method;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The paper is devoted to the problem of fault detection in analog electrical circuits described by linear or nonlinear polynomial models. So-called data-driven method for fault detection is considered. This method assumes that parameters of the circuit under consideration may be unknown. It does not use methods of identification and allows checking whether or not parameters of some elements deviate considerably from their nominal values.
引用
收藏
页码：90 / 95
页数：6
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