Quantitative determination of contact stiffness using atomic force acoustic microscopy

被引：241

作者：

Rabe, U ^{[1
]}

Amelio, S ^{[1
]}

Kester, E ^{[1
]}

Scherer, V ^{[1
]}

Hirsekorn, S ^{[1
]}

Arnold, W ^{[1
]}

机构：

[1] Univ Saarbrucken, Fraunhofer Inst Nondestruct Testing IZFP, D-66123 Saarbrucken, Germany

来源：

ULTRASONICS | 2000年 / 38卷 / 1-8期

关键词：

acoustics; atomic force microscopy; beams; contact stiffness; flexural vibrations; ultrasonics; Young's modulus;

D O I：

10.1016/S0041-624X(99)00207-3

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

Atomic force acoustic microscopy is a near-field technique which combines the ability of ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively, with a resolution of approximately 20 nm, exploiting the contact resonance frequencies of standard cantilevers used in atomic force microscopy. The Young's modulus of nanocrystalline ferrite films has been measured as a function of oxidation temperature. Furthermore, images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：430 / 437

页数：8

共 50 条

[1] Quantitative contact spectroscopy by atomic-force acoustic microscopy
Amelio, S
Rabe, U
Kester, E
Hirsekorn, S
Arnold, W
[J]. MICRO MATERIALS, PROCEEDINGS, 2000, : 340 - 343
[2] Quantitative contact spectroscopy by atomic-force acoustic microscopy
Rabe, U
Kester, E
Scherer, V
Arnold, W
[J]. ACOUSTICAL IMAGING, VOL 24, 2000, 24 : 179 - 186
[3] Quantitative contact spectroscopy and imaging by atomic-force acoustic microscopy
Arnold, W
Amelio, S
Hirsekorn, S
Rabe, U
[J]. NONDESTRUCTIVE METHODS FOR MATERIALS CHARACTERIZATION, 2000, 591 : 183 - 194
[4] Atomic force acoustic microscopy: Influence of the lateral contact stiffness on the elastic measurements
Flores-Ruiz, F. J.
Espinoza-Beltran, F. J.
Diliegros-Godines, C. J.
Siqueiros, J. M.
Herrera-Gomez, A.
[J]. ULTRASONICS, 2016, 71 : 271 - 277
[5] MEASUREMENT OF EPOXY STIFFNESS BY ATOMIC FORCE ACOUSTIC MICROSCOPY
Zhao, Wei
Korach, Chad S.
[J]. IMECE 2009: PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION, VOL 12, PTS A AND B, 2010, : 85 - 87
[6] Actuation of atomic force microscopy microcantilevers using contact acoustic nonlinearities
Torello, D.
Degertekin, F. Levent
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (11):
[7] Mapping of elastic stiffness in an α+β titanium alloy using atomic force acoustic microscopy
Kumar, Anish
Rabe, Ute
Arnold, Walter
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (07) : 6077 - 6080
[8] Contact stiffness modulation in contact-mode atomic force microscopy
Kirrou, Ilham
Belhaq, Mohamed
[J]. INTERNATIONAL JOURNAL OF NON-LINEAR MECHANICS, 2013, 55 : 102 - 109
[9] Quantitative determination of surface energry using atomic force microscopy: the case of hydrophobic/hydrophobic contact and hydrophilic/hydrophilic contact
Awada, H
Castelein, G
Brogly, M
[J]. SURFACE AND INTERFACE ANALYSIS, 2005, 37 (09) : 755 - 764
[10] Critical factors in quantitative Atomic Force Acoustic Microscopy
Marinello, F.
Schiavuta, P.
Carmignato, S.
Savio, E.
[J]. CIRP JOURNAL OF MANUFACTURING SCIENCE AND TECHNOLOGY, 2010, 3 (01) : 49 - 54

← 1 2 3 4 5 →